Method and apparatus for separating the reference current from the input signal in sigma-delta converter

ABSTRACT

An integrator system may have a pair of sampling circuits each having a sampling capacitor to sample a respective component of a differential input signal, and an integrator having inputs coupled to outputs of the sampling circuits. The system may have a shorting switch coupled between input terminals of the sampling capacitors. The shorting switch may be engaged during an interstitial phase between sampling and output phases of the sampling circuits. By shorting input terminals of the sampling capacitors together, the design reduces current drawn by the system and, in some designs, severs relationships between current draw and information content sampled by the system. Configurations are disclosed for analog and digital input signals.

CROSS-REFERENCE TO RELATED APPLICATIONS

The present invention benefits from priority afforded by U.S. patent application Ser. No. 61/597,342, entitled “Method and Apparatus for Separating the Reference Current from the Input Signal in Sigma-Delta Converter,” filed Feb. 10, 2012, the disclosure of which is incorporated herein in its entirety.

BACKGROUND

The present invention relates to sigma delta (ΣΔ) converters.

In conventional ΣΔ converters, a front-end stage samples an input voltage with charge storage components (i.e., storage capacitors), and the charge is then accumulated on another set of components (i.e., integrating capacitors). The integrated samples are then quantized by an analog-to-digital converter (ADC), for example, a flash ADC. The ADC output is also looped back via a feedback DAC to be subtracted from the input voltage. The feedback DAC samples a reference voltage dependent on the ADC output bit state(s).

FIG. 1 illustrates a conventional single phase switched capacitor integrator that can be provided in a ΣΔ front-end stage with an associated operation timing diagram. In FIG. 1, the input voltage V_(x) (or −V_(x) depending on input capacitor polarity), where V_(x)=V_(x+)−V_(x−), is sampled onto input capacitors C_(ina) and C_(inb) based on timing signals φ₁ and φ₂. The left hand side (LHS) switches are controlled by timing signals φ₁ and φ₂, while the right hand side (RHS) switches are controlled by φ_(1r) and φ_(2r). The two sets of timing signals generally have the same phase relationship; however, the rising and falling edges may be slightly different to minimize undesirable effects, such as charge injection. The details of the slight differences are not described here. The above circuit is sampled at frequency f_(s), and V_(s) is a supply voltage. The timing signals φ₁ and φ₂ alternate and, hence, their respective rising and falling edges are substantially synchronized. Thus, the average current drawn from nodes V_(x+) and V_(x−) occurs as follows:

I _(V) _(x+) = −I _(V) _(x−) =2V _(x) f _(s) C _(in),  Eq. 1

where C_(in)=C_(ina)=C_(inb). The average current drawn varies based on the content of the input signal because the average current will flow from the node with higher potential into the node with lower potential and is not altered by the amount charge transferred to the output of the circuit. Simply stated, the average current drawn is a function of V_(x), f_(s), and C_(in).

FIG. 2 illustrates a conventional single phase-switched capacitor integrator that can be provided in a ΣΔ feedback DAC with an associated operation timing diagram. In FIG. 2, a reference voltage V_(ref), where V_(ref)=V_(ref+)−V_(ref−), is sampled onto input capacitors C_(refa) and C_(refb) based on timing signals φ₁ and φ₂, which are modulated by an information signal (y(n)). The LHS switches have control inputs coupled to timing signals φ₁ and φ₂, while the RHS switches are controlled by φ_(1r) and φ_(2r). The two sets of timing signals generally have the same phase relationship as illustrated; however, the rising and falling edges may be slightly different to minimize undesirable effects such as charge injection. The details of the slight differences are not described here. The above circuit is sampled at frequency f_(s). The timing signals φ₁ and φ₂ alternate and, hence, their respective rising and falling edges are substantially synchronized. Also, the LHS switches are controlled by the state of a previous output stage y(n). Thus, the average current drawn by the circuit can be expressed as:

$\begin{matrix} \begin{matrix} {\overset{\_}{I_{{Vref}\; +}} = \overset{\_}{- I_{{Vref}\; -}}} \\ {= {{2\; V_{ref}f_{s}C_{ref}} - {\frac{1}{2}V_{ref}f_{s}C_{ref}{{{y(n)} - {y\left( {n - 1} \right)}}}}}} \end{matrix} & {{Eq}.\mspace{14mu} 2} \end{matrix}$

Here, the LHS feedback introduces a dependency between the current drawn from the reference voltage and a state of a previous output stage y(n). Hence, any series impedance on the reference nodes can cause non-linear modulation of the effective reference voltage, inducing tonal behavior, which distorts the output signal.

Accordingly, the inventors perceive a need in the art for ΣΔ structure having input circuits that conserve current consumption, whose current draw is not dependent on variation in input signal and that delivers outputs with greater accuracy than prior systems.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1( a), 1(b), 2(a), and 2(b) illustrate known integrator systems and their respective timing signals.

FIGS. 3( a) and 3(b) illustrate an integrator system and control signals according to an embodiment of the present invention.

FIG. 4 is a simplified block diagram of a converter according to an embodiment of the present invention.

FIGS. 5( a) and 5(b) illustrate an integrator system and control signals according to another embodiment of the present invention.

FIGS. 6( a) and 6(b) illustrate an integrator system and control signals according to a further embodiment of the present invention.

FIGS. 7( a) and 7(b) illustrate an integrator system and control signals according to another embodiment of the present invention.

FIG. 8 illustrates an integrator system according to a further embodiment of the present invention.

FIG. 9 illustrates an integrator system according to another embodiment of the present invention.

DETAILED DESCRIPTION

Embodiments of the present invention provide an integrator system having a pair of sampling circuits each having a sampling capacitor to sample a respective component of a differential input signal, and an integrator having inputs coupled to outputs of the sampling circuits. The system may have a shorting switch coupled between input terminals of the sampling capacitors. The shorting switch may be engaged during interstitial phases between sampling and output phases of the sampling circuits. By shorting input terminals of the sampling capacitors together, the design reduces current drawn by the system and, in some designs, severs relationships between current draw and information content sampled by the system.

FIG. 3 illustrates an integrator system 300 according to an embodiment of the present invention. As illustrated in FIG. 3( a), the integrator system 300 may include a pair of sampling circuits 302, 304, an integrating amplifier 306 and a shorting switch 308. The system 300 may accept an input signal V_(IN) that is represented within the integrator system 300 as a pair of inputs V_(IN+), V_(IN−) that vary differentially with respect to each other. The sampling circuits 302, 304, may sample respective components V_(IN+), V_(IN−) of the input signal V_(IN) and present it to the integrating amplifier 306. The integrating amplifier 306, as its name implies, may integrate the sampled input signal and generate an output signal V_(Y) therefrom.

The sampling circuits 302, 304 each may include a sampling capacitor, C_(INA), C_(INB) and a variety of switches SW_(A.1)-SW_(A.4), SW_(B.1)-SW_(B.4). A first terminal of each sampling capacitor C_(INA), C_(INB) (called an “input terminal,” for convenience) may be connected to the V_(IN+) terminals by a respective first switch SW_(A.1), SW_(B.3). The input terminal of each sampling capacitors C_(INA), C_(INB) also may be connected to the V_(IN)-terminals by a respective second switch SW_(A.3), SW_(B.1). A second terminal of each sampling capacitor C_(INA), C_(INB) (called an “output terminal,” for convenience) may be connected to a reference voltage V_(S) by a respective third switch SW_(A.2), SW_(B.2). The V_(S) voltage may be a virtual ground for the integrating amplifier 306. The output terminal of each sampling capacitor C_(INA), C_(INB) may be connected to the integrating amplifier 306 by a respective fourth switch SW_(A.4), SW_(B.4). The switches SW_(A.1) and SW_(B.1) may be controlled by a first control signal φ₁, switches SW_(A.2) and SW_(B.2) may be controlled by a second control signal φ₂, switches SW_(A.3) and SW_(B.3) may be controlled by a third control signal φ₃ and switches SW_(A.4) and SW_(B.4) may be controlled by a fourth control signal φ₄.

A shorting switch 308 may connect the input terminals of the sampling capacitors C_(INA), C_(INB) to each other. The shorting switch 308 may be controlled by another control signal φ_(SH).

The integrating amplifier 306 may include a differential amplifier 310 and a pair of feedback capacitors C_(FA), C_(FB). The first feedback capacitor C_(FA) may be coupled between a non-inverting input 312 and an inverting output 316 of the amplifier 310. The second feedback capacitor C_(FB) may be coupled between an inverting input 314 and a non-inverting output 318 of the amplifier 310. The non-inverting input 312 may be connected to an output of sampling circuit 304 (switch SW_(B.4)) and the inverting input 314 may be connected to an output of sampling circuit 302 (switch SW_(A.4)).

FIG. 3( b) illustrates control signals that may be applied to the integrator system 300 according to an embodiment of the present invention. FIG. 3( b) illustrates four phases of operation P1-P4 that may repeat throughout operation of the integrator system 300. Two phases P2 and P4 may be operational phases during which the sampling circuits 302 and 304 may be connected to an input signal V_(IN) to alternately sample the input signal V_(IN) (phase P2) and drive the sampled signal to the integrating amplifier 306 (phase P4). Two other phases P1 and P3 may be reset phases during which input terminals of the sampling capacitors C_(INA), C_(INB) may be set to voltages at intermediate levels between V_(IN+) and V_(IN−) through charge redistribution.

In a first phase P1, the φ₁, φ₃ and φ₄ signals are shown as low and the φ₂ and φ_(SH) signals are shown as high. Thus, switches SW_(A.2), SW_(B.2) and 308 may be closed and switches SW_(A.1), SW_(A.3)-SW_(A.4) and SW_(B.1), SW_(B.3)-SW_(B.4) all may be open. Closure of the shorting switch 308 may cause charge sharing between first terminals of the sampling capacitors C_(INA), C_(INB), which may move the voltage at the first terminals to a common mode value (V_(CM)) of the input signals V_(IN+), V_(IN−), which was developed in a prior phase of operation (shown as P0). No current is drawn from the V_(IN+) and V_(IN−) inputs. Closure of the switches SW_(A.2), SW_(B.2) may connect output terminals of the capacitors C_(INA), C_(INB) to the V_(S) reference voltage. Thus, during phase P1, the capacitors each may sample a voltage of V_(CM)−V_(S), where V_(CM)=½(V_(IN+)+V_(IN−)).

In a second phase P2, the φ_(SH) signal may transition low and the φ₁ signal may transition high. The other control signals φ₂, φ₃ and φ₄ may remain unchanged from phase P1. Thus, switches SW_(A.1), SW_(B.1) may connect input terminals of the sampling capacitors C_(INA), C_(INB) to V_(IN+) and V_(IN−), respectively. Switches SW_(A.2) and SW_(B.2) may remain closed. The sampling capacitor C_(INA) may sample a voltage as V_(IN+)−V_(S) and the sampling capacitor C_(INB) may sample a voltage as V_(IN−)−V_(S). Switches SW_(A.3), SW_(A.4), SW_(B.3), SW_(B.4) and 308 all may be open. The φ₁ and φ₂ signals may transition low on conclusion of the second phase P2.

In a third phase P3, the φ₁, φ₂ and φ₃ signals are shown as low and the φ₄ and φ_(SH) signals are shown as high. Thus, switches SW_(A.4), SW_(B.4) and 308 may be closed and switches SW_(A.1)-SW_(A.3) and SW_(B.1)-SW_(B.3) all may be open. Closure of the shorting switch 308 may cause charge sharing between first terminals of the sampling capacitors C_(INA), C_(INB), which may move the voltage at the first terminals to a common mode value (V_(CM)) of the input signals V_(IN+), V_(IN−), which was developed in phase P2. No current is drawn from the V_(IN+) and V_(IN−) inputs. Closure of the switches SW_(A.4), SW_(B.4) may connect output terminals of the sampling capacitors C_(INA), C_(INB) to the integrating amplifier 306.

In a fourth phase P4, the φ_(SH) signal may transition low and the φ₃ signal may transition high. The other control signals φ₁, φ₂ and φ₄ may remain unchanged from phase P3. Thus, switches SW_(A.3), SW_(B.3), SW_(A.4) and SW_(B.4) may be closed and switches SW_(A.1), SW_(A.2), SW_(B.1) and SW_(B.2) and 308 all may be open. In phase P4, the input terminal of sampling capacitor C_(INA) may be connected to the V_(IN−) terminal by switch SW_(A.3) and the input terminal of sampling capacitor C_(INB) may be connected to the V_(IN+) terminal by the switch SW_(B.3). These connections may force a change in voltage at the outputs V_(Y+), V_(Y−) of the integrating amplifier 306 that corresponds to the difference between V_(IN+) and V_(IN−).

Operation of phases P1-P4 may repeat throughout operation of the integrator system 300. Thus, phase P5 is shown as a subsequent iteration of phase P1 and phase P0 is shown as a prior iteration of phase P4. V_(IN+) and V_(IN−) may be time-varying signals and, therefore, the change in output voltage (V_(Y+)−V_(Y−)) also may vary in these iterations.

In an embodiment, the integrator system 300 may include a controller 320 that generates the φ₁, φ₂, φ₃, φ₄ and φ_(SH), control signals in response to an input clock signal CLK that establishes timing reference for the integrator system 300. The controller 320 may be a state machine that is driven by the input clock CLK. In an embodiment, the controller 320 may include a register (not shown) that defines a sampling period for the integrator system 300 and, consequently, its sampling frequency. The register may allow the sampling frequency to be a dynamically programmable value.

As indicated, input terminals of the sampling capacitors C_(INA), C_(INB) in the sampling circuits 302, 304 may be shorted at each phase P1 and P3. The input terminals of the sampling capacitors C_(INA), C_(INB), therefore, may charge to an intermediate level of the input signal V_(IN), specifically its common mode value. In an embodiment, when C_(FA)=C_(FB)=C_(F), C_(INA)=C_(INB)=C_(IN), the average current drawn from nodes V_(IN+) and V_(IN−) may be expressed as:

I _(V) _(IN+) = −I _(V) _(IN−) =V _(IN) f _(s) C _(in).  Eq. 3

As compared to the current draw of the FIG. 1 configuration (Eq. 1), the integrator system 300 of FIG. 3( a) conserves current by a factor of two (Eq. 3).

In an embodiment, a falling transition of the φ₂ signal may precede a falling transition of the φ₁ signal in the P2 phase to mitigate against charge injection errors that otherwise might occur. Similarly, a falling transition of the φ₄ signal may precede a falling transition of the φ₃ signal in the P4 phase, again to mitigate against charge injection errors that otherwise might occur.

In another embodiment, the sampling circuits 302, 304 may operate under influence of a control signal (CTR). For example in a feedback component embodiment of a ΣΔ converter, a control signal CTR may also be provided to dynamically adjust switch states. Thus, control signals to the input switches SW_(A.1), SW_(A.3), SW_(B.1) and SW_(B.3) of the sampling circuits 302, 304 may be generated from a logical combination of the CTR signal and the respective φ₁ or φ₃ signal and may be switched per phase. The CTR signal may be a feedback control signal provided in a feedback path of a converter. For example, if the integrator system 300 is implemented in a feedback DAC embodiment, the CTR signal may correspond to the ΣΔ converter output bit state (y(n)). The controller 320 may perform a logical combination of a feedback signal FB and the φ₁, φ₃ signals to generate the CTR signal. In such embodiments, discussed hereinbelow, the average current draw of the circuit may be independent of information content of the CTR signal.

The embodiment of FIG. 3 illustrates switch control signals that are “active high,” that is, the switches SW_(A.1)-SW_(A.4), SW_(B.1)-SW_(B.4) and 308 all are shown as closing when their associated control signals transition from a low voltage to a high voltage. In such an embodiment, the switches SW_(A.1)-SW_(A.4), SW_(B.1)-SW_(B.4) and 308 may be provided as NMOS transistors. In an alternate embodiment, the switch control signals may be provided as “active low” signals, which would cause the switches SW_(A.1)-SW_(A.4), SW_(B.1)-SW_(B.4) and 308 to close when their associated control signals transition from a high voltage to a low voltage. In such an embodiment, the switches SW_(A.1)-SW_(A.4), SW_(B.1)-SW_(B.4) and 308 may be provided as PMOS transistors. In another embodiment, each switch may be provided as a pair of transistors, an NMOS transistor and a PMOS transistor, having their sources and drains coupled together. In this latter embodiment, each control signal φ₁, φ₂, φ₃, φ₄ may be provided as a pair of control signals, one as an active high signal for the NMOS switch and another as an active low signal for the PMOS switch.

FIG. 4 is a functional block diagram of a ΣΔ modulator 400 according to an embodiment of the present invention. The modulator 400 may generate a digital output signal y(n) from an analog input voltage, shown as V_(X). The modulator 400 may include a subtractor 410, a loop filter 420, an analog to digital converter 430 and a digital to analog converter (DAC) 440 provided in feedback. The subtractor 410 may have inputs for the input voltage V_(X) and for a feedback signal, which is an analog representation of the output signal V_(Y). The subtractor 410 may output an analog signal ΔV representing a difference between these two inputs (ΔV=V_(X)−V_(Y)), which may be input to the loop filter 420. The loop filter circuit 420 may sample the voltage presented to it and hold it for digitization by the ADC 430. In an embodiment, the loop filter 420 may include an integrator 422 as described in FIG. 3, 5 or 8. The ADC 430 may output a digitized representation of the voltage presented by the integrator 422, which may be output from the modulator 400 as the output value y(n). In one implementation, the ADC 430 may be a flash ADC.

The DAC 440 may be provided in a feedback path of the modulator 400. The DAC 440 may generate an analog voltage from the output value y(n). Various DAC circuit embodiments are described below in FIGS. 6 and 7.

Optionally, the modulator 400 may include a shuffler 450 in the feedback path that randomizes use of components within the DAC 440 to generate the analog feedback voltage V_(Y). That is, the DAC 440 may include a variety of elements (not shown) that, in ideal circumstances, would contribute equally to the analog feedback voltage V_(Y) but, due to manufacturing errors, may have relative offset errors. If the modulator 400 generates common output values at different times (e.g., y(i)=y(j) for i≠j), the shuffler 450 may select different combinations of the equal-contribution elements so as to frequency shape error values in the feedback voltage V_(Y).

As indicated, FIG. 4 is a functional block diagram of a ΣΔ modulator 400. When the a ΣΔ modulator 400 is manufactured in an integrated circuit, the circuit need not possess discrete circuit elements representing the subtractor, loop filter 420 and DAC 440. For example, the subtractor 410 may be performed by charge transfer elements that are provided within circuit components of the integrator 422. The subtractor may induce a charge transfer (ΔQ) whose value is proportional to a difference between the input voltage V_(X) and the analog feedback voltage V_(Y).

The loop filter 420 may perform other operations typical for ΣΔ converters 400, such as filtering to produce characteristic noise shaping of a sigma-delta modulator. In this regard, the loop filter 420 may include one or more integrator stages, depending on design requirements. In an embodiment, the loop filter 420 may include an integrator 422 as described in FIG. 3, 5 or 8. Other design considerations of loop filters are immaterial to the present discussion and, therefore, are omitted.

As can be observed in FIG. 3( b), given a fixed sampling frequency, the introduction of a reset phases P1 and P3 (φ_(SH)) into operation of an integrator reduces an amount of time that can be devoted to operational phases P2 and P4. However, in multi-bit implementations with the employ of a feedback DAC 440 and shuffler 450, the reset phases P1 and P3 (φ_(SH)) may be designed to coincide with the shuffler 450 propagation time. In this manner, the reset phases P1 and P3 (φ_(SH)) may be introduced to a modulator 400 without adding additional constraints on the system or otherwise lowering its throughput.

FIG. 5 illustrates an integrator system 500 and control signals according to another embodiment of the present invention. As illustrated in FIG. 5( a), the integrator system 500 may include a pair of sampling circuits 502, 504, an integrating amplifier 506 and a shorting switch 508. The integrator system 500 may accept the input signal V_(X) as a pair of differential inputs V_(X+), V_(X−) that vary about a common mode voltage V_(CM) (not shown). The sampling circuits 502, 504, may sample respective components V_(X+), V_(X−) of the input signal V_(X) and present it to the integrating amplifier 506. The integrating amplifier 506, as its name implies, may integrate the sampled input signal V_(X) and generate an output signal V_(Y) therefrom.

The sampling circuits 502, 504 each may include a sampling capacitor C_(INA), C_(INB) and a variety of switches SW_(A.1)-SW_(A.4), SW_(B.1)-SW_(B.4). A first terminal of each sampling capacitor C_(INA), C_(INB) (again, “input terminal”) may be connected to the V_(X+) terminals by a respective switch SW_(A.1), SW_(B.3). The input terminal of each sampling capacitors C_(INA), C_(INB) also may be connected to the V_(X−) terminals by a respective second switch SW_(A.3), SW_(B.1). A second terminal of each sampling capacitor C_(INA), C_(INB) (“output terminal”) may be connected to a reference voltage V_(S) by a respective third switch SW_(A.2), SW_(B.2). The output terminal of each sampling capacitor C_(INA), C_(INB) may be connected to the integrating amplifier 506 by a respective fourth switch SW_(A.4), SW_(B.4). The switches SW_(A.1) and SW_(B.1) may be controlled by a first control signal φ₁, switches SW_(A.2) and SW_(B.2) may be controlled by a second control signal φ₂, switches SW_(A.3) and SW_(B.3) may be controlled by a third control signal φ₃ and switches SW_(A.4) and SW_(B.4) may be controlled by a fourth control signal φ₄.

A shorting switch 508 may connect the input terminals of the sampling capacitors C_(INA), C_(INB) to each other. The shorting switch 508 may be controlled by another control signal φ_(SH).

The integrating amplifier 506 may include a differential amplifier 510 and a pair of feedback capacitors C_(FA), C_(FB). The first feedback capacitor C_(FA) may be coupled between a non-inverting input 512 and an inverting output 516 of the amplifier 510. The second feedback capacitor C_(FB) may be coupled between an inverting input 514 and a non-inverting output 518 of the amplifier 510. The non-inverting input 512 may be connected to an output of sampling circuit 504 (switch SW_(B.4)) and the inverting input 514 may be connected to an output of sampling circuit 502 (switch SW_(A.4)).

FIG. 5( b) illustrates control signals that may be applied to the integrator system 500 according to an embodiment of the present invention. FIG. 5( b) illustrates four phases of operation P1-P4 that may repeat throughout operation of the integrator system 500. Two phases P2 and P4 may be operational phases during which the sampling circuits 502 and 504 may be connected to an input signal V_(X) to alternately sample the input signal and drive the input signal to the integrating amplifier 506. Two other phases P1 and P3 may be reset phases during which the input terminals of the sampling capacitors C_(INA), C_(INB) may be set to voltages at intermediate levels between V_(X+) and V_(X−) through charge redistribution.

In a first phase P1, the φ₁, φ₃ and φ₄ signals are shown as low and the φ₂ and φ_(SH) signals are shown as high. Thus, switches SW_(A.2), SW_(B.2) and 508 may be closed and switches SW_(A.1), SW_(A.3)-SW_(A.4) and SW_(B.1), SW_(B.3)-SW_(B.4) all may be open. Closure of the shorting switch 508 may cause charge sharing between first terminals of the sampling capacitors C_(INA), C_(INB), which may move the voltage at the first terminals to a common mode value (V_(CM)) of the input signals V_(X+), V_(X−), which was developed in a prior phase of operation (shown as P0). No current is drawn from the V_(X+) and V_(X−) inputs. Closure of the switches SW_(A.2), SW_(B.2) may connect output terminals of the capacitors C_(INA), C_(INB) to the V_(S) reference voltage. Thus, during phase P1, the capacitors each may sample a voltage of V_(CM)−V_(S), where V_(CM)=½(V_(X+)+V_(X−)).

In a second phase P2, the φ_(SH) signal may transition low and the φ₁ signal may transition high. The other control signals φ₂, φ₃ and φ₄ may remain unchanged from phase P1. Thus, switches SW_(A.1), SW_(B.1) may connect input terminals of the sampling capacitors C_(INA), C_(INB) to V_(X+) and V_(X−) respectively. Switches SW_(A.2) and SW_(B.2) may remain closed. The sampling capacitor C_(INA) may sample a voltage as V_(X+)−V_(S) and the sampling capacitor C_(INB) may sample a voltage as V_(X−)−V_(S). Switches SW_(A.3), SW_(A.4), SW_(B.3), SW_(B.4) and 508 all may be open. The φ₁ and φ₂ signals may transition low on conclusion of the second phase P2.

In a third phase P3, the φ₁, φ₂ and φ₃ signals are shown as low and the φ₄ and φ_(SH) signals are shown as high. Thus, switches SW_(A.4), SW_(B.4) and 508 may be closed and switches SW_(A.1)-SW_(A.3) and SW_(B.1)-SW_(B.3) all may be open. Closure of the shorting switch 508 may cause charge sharing between first terminals of the sampling capacitors C_(INA), C_(INB), which may move the voltage at the first terminals to a common mode value (V_(CM)) of the input signals V_(X+), V_(X−). No current is drawn from the V_(X+) and V_(X−) inputs. Closure of the switches SW_(A.4), SW_(B.4) may connect output terminals of the capacitors C_(INA), C_(INB) to the integrating amplifier 506.

In a fourth phase P4, the φ_(SH) signal may transition low and the φ₃ signal may transition high. The other control signals φ₁, φ₂ and φ₄ may remain unchanged from phase P3. Thus, switches SW_(A.3), SW_(B.3), SW_(A.4) and SW_(B.4) may be closed and switches SW_(A.1), SW_(A.2), SW_(B.1) and SW_(B.2) and 508 all may be open. In phase P4, the input terminal of capacitor C_(INA) may be connected to the V_(X−) terminal by switch SW_(A.3) and the input terminal of capacitor C_(INB) may be connected to the V_(X+) terminal by the switch SW_(B.3). These connections may force a change in voltage to the outputs V_(Y+), V_(Y−) of the integrating amplifier 506 that corresponds to the difference between V_(X+) and V_(X−).

Operation of phases P1-P4 may repeat throughout operation of the integrator system 500. Thus, phase P5 is shown as a subsequent iteration of phase P1 and phase P0 is shown as a prior iteration of phase P4. Again, changes in the output voltage (V_(Y+)−V_(Y−)) may vary from iteration to iteration.

In an embodiment, the integrator 500 may include a controller 520 that generates the φ₁, φ₂, φ₃, φ₄ and φ_(SH) control signals in response to an input clock signal CLK that establishes timing reference for the integrator 500. The controller 520 may be a state machine that is driven by the input clock CLK. In an embodiment, the controller 520 may include a register (not shown) that defines a sampling period for the integrator 500 and, consequently, its sampling frequency. The register may allow the sampling frequency to be a dynamically programmable value.

In an embodiment, a falling transition of the φ₂ signal may precede a falling transition of the φ₁ signal in the P2 phase to mitigate against charge injection errors that otherwise might occur. Similarly, a falling transition of the φ₄ signal may precede a falling transition of the φ₃ signal in the P4 phase, again to mitigate against charge injection errors that otherwise might occur.

FIG. 6 illustrates an integrator system 600 and control signals according to another embodiment of the present invention. As illustrated in FIG. 6( a), the integrator system 600 may include a pair of sampling circuits 602, 604, an integrating amplifier 606 and a shorting switch 608. The integrator system 600 may accept a digital input signal that is represented within the integrator system 600 as a pair of input control signals S₁, S₂. The sampling circuits 602, 604, may sample respective components V_(REF+), V_(REF−) of a reference voltage V_(REF) in an orientation set by the control signals S₁, S₂ (which may be derived from a sampled signal y(n)) to the integrating amplifier 606. The integrating amplifier 606, as its name implies, may integrate the sampled reference voltages V_(REF+), V_(REF−) under control of the S₁, S₂ control signals and may generate an output signal V_(Y) therefrom.

The sampling circuits 602, 604 each may include a sampling capacitor, C_(INA), C_(INB) and a variety of switches SW_(A.1)-SW_(A.4), SW_(B.1)-SW_(B.4). A first terminal of each sampling capacitor C_(INA), C_(INB) (again, “input terminal”) may be connected to reference voltages V_(REF+) and V_(REF−). Specifically, the input terminals of the sampling capacitors C_(INA), C_(INB) may be connected to the V_(REF+) voltage source by respective switches SW_(A.1), SW_(B.3), which may be controlled by the first control signals S₁ (SW_(A.1)) and S₂ (SW_(B.3)) respectively. The input terminals of the sampling capacitors C_(INA), C_(INB) also may be connected to the V_(REF−) voltage source by respective second switches SW_(A.3), SW_(B.1), which may be controlled by the second control signals S₂ (SW_(A.3)) and S₁ (SW_(B.1)) respectively. Second terminals of the sampling capacitors C_(INA), C_(INB) (“output terminal”) may be connected to a reference voltage V_(S) by respective third switches SW_(A.2), SW_(B.2), which may be controlled by a third control signal φ₂. The output terminals of the sampling capacitors C_(INA), C_(INB) may be connected to the integrating amplifier 606 by respective fourth switches SW_(A.4), SW_(B.4), which may be controlled by a fourth control signal φ₄.

A shorting switch 608 may connect the input terminals of the sampling capacitors C_(INA), C_(INB) to each other. The shorting switch 608 may be controlled by another control signal φ_(SH).

The integrating amplifier 606 may include a differential amplifier 610 and a pair of feedback capacitors C_(FA), C_(FB). The first feedback capacitor C_(FA) may be coupled between a non-inverting input 612 and an inverting output 616 of the amplifier 610. The second feedback capacitor C_(FB) may be coupled between an inverting input 614 and a non-inverting output 618 of the amplifier 610. The non-inverting input 612 may be connected to an output of sampling circuit 604 (switch SW_(B.4)) and the inverting input 614 may be connected to an output of sampling circuit 602 (switch SW_(A.4)).

As indicated, information content may be input to the integrator 600 by the S₁ and S₂ control signals that connect the sampling capacitors C_(INA), C_(INB) to the reference voltage sources V_(REF+), V_(REF−). Each S₁ and S₂ control signal may take one of the states of control signals φ₁ or φ₃ (FIG. 6( b)) based on the state of the input signal y(n). For convenience, it is useful to consider y(n) as having values 1 or −1. When y(n) has a value of 1, the S₁ control signal may be set to the φ₁ state and the S₂ control signal may be set to the φ₃ state. Alternatively, when y(n) has a value of 1, the S₁ control signal may be set to the φ₃ state and the S₂ control signal may be set to the φ₁ state.

FIG. 6( b) illustrates exemplary control signals that may be applied to the integrator system 600 according to an embodiment of the present invention. FIG. 6( b) illustrates an example where y(n)=1 and, therefore, S₁=φ₁ and S₂=φ₃. FIG. 6( b) illustrates four phases of operation P1-P4 that may repeat throughout operation of the integrator system 600. Two phases P2 and P4 may be operational phases during which the sampling circuits 602 and 604 may be connected to reference voltages V_(REF+), V_(REF−) to alternately sample voltages as determined by the control signals S₁, S₂ and drive the sampled voltages to the integrating amplifier 606. Two other phases P1 and P3 may be reset phases during which the input terminals of the sampling capacitors C_(INA), C_(m) may be set to voltages at intermediate levels between V_(REF+) and V_(REF−) based on charge redistribution. In this manner, the integrator system 600 may process an input signal y(n) and yet establishes independence between the current drain drawn from the reference inputs V_(REF+) and V_(REF−) and the input signal y(n).

In a first phase P1, the S₁, S₂ and φ₄ signals are shown as low and the φ₂ and φ_(SH), signals are shown as high. Thus, switches SW_(A.2), SW_(B.2) and 608 may be closed and switches SW_(A.1), SW_(A.3)-SW_(A.4) and SW_(B.1), SW_(B.3)-SW_(B.4) all may be open. Closure of the shorting switch 608 may cause charge sharing between first terminals of the sampling capacitors C_(INA), C_(INB), which may move the voltage at the input terminals to a common mode value (V_(CM)) of the input signals V_(REF+), V_(REF−), which was developed in a prior phase of operation (shown as P0). No current is drawn from the V_(REF+) and V_(REF−) sources. Closure of the switches SW_(A.2), SW_(B.2) may connect output terminals of the capacitors C_(INA), C_(INB) to the V_(S) reference voltage. Thus, during phase P1, the capacitors each may sample a voltage of V_(CM)−V_(S), where V_(CM)=½(V_(REF+)+V_(REF−)).

In a second phase P2, the φ_(SH) signal may transition low and the S₁ signal may transition high. The other control signals S₂, φ₂ and φ₄ may remain unchanged from phase P1. Thus, switches SW_(A.1), SW_(B.1) may connect input terminals of the sampling capacitors C_(INA), C_(INB) to V_(REF+) and V_(REF−), respectively. Switches SW_(A.2) and SW_(B.2) may remain closed. The sampling capacitor C_(INA) may sample a voltage as V_(REF+)−V_(S) and the sampling capacitor C_(INB) may sample a voltage as V_(REF−)−V_(S). Switches SW_(A.3), SW_(A.4), SW_(B.3), SW_(B.4) and 608 all may be open. The S₁ and φ₂ signals may transition low on conclusion of the second phase P2.

In a third phase P3, the S₁, S₂ and φ₂ signals are shown as low and the φ₄ and φ_(SH) signals are shown as high. Thus, switches SW_(A34), SW_(B.4) and 608 may be closed and switches SW_(A.1)-SW_(A.3) and SW_(B.1)-SW_(B.3) all may be open. Closure of the shorting switch 608 may cause charge sharing between first terminals of the sampling capacitors C_(INA), C_(INB), which may move the voltage at the first terminals to a common mode value (V_(CM)) of the input signals V_(REF+), V_(REF−). No current is drawn from the V_(REF+) and V_(REF−) sources. Closure of the switches SW_(A.4), SW_(B.4) may connect output terminals of the capacitors C_(INA), C_(INB) to the integrating amplifier 606.

In a fourth phase P4, the φ_(SH), signal may transition low and the S₂ signal may transition high. The other control signals S₁, φ₂ and φ₄ may remain unchanged from phase P3. Thus, switches SW_(A.3), SW_(B.3), SW_(A.4) and SW_(B.4) may be closed and switches SW_(A.1), SW_(A.2), SW_(B.1) and SW_(B.2) and 608 all may be open. In phase P4, the input terminal of capacitor C_(INA) may be connected to the V_(REF−) terminal by switch SW_(A.3) and the input terminal of capacitor C_(INB) may be connected to the V_(REF+) terminal by the switch SW_(B.3). These connections may force a change in voltage to the outputs V_(Y+), V_(Y−) of the integrating amplifier 606 that corresponds to the difference between V_(REF+) and V_(REF−). In addition the direction of change in voltage may depend on phasing of the control signals S₁, S₂, which may be derived from y(n).

As noted, the discussion above relates to a circumstance in which y(n)=1. If y(n)=1, then the S₁ signal would have taken the form of the φ₃ signal and transitioned high in phase P3. Similarly, the S₂ signal would have taken the form of the φ₁ signal and transitioned high in phase P1. Thus, the S₁, S₂ signals are modulated with information content from the y(n) input signal.

Operation of phases P1-P4 may repeat throughout operation of the integrator system 600. Thus, phase P5 is shown as a subsequent iteration of phase P1 and phase P0 is shown as a prior iteration of phase P4. Again, the change in the output voltage (V_(y+)−V_(y−)) may vary from iteration to iteration. Of course, the control signals S₁, S₂ may vary in subsequent iterations based on new values of y(n) and, therefore, operation need not repeat from iteration to iteration.

As in the prior embodiments, falling transitions of the φ₂ and φ₄ signals may precede falling transitions of the S₁, S₂ signals in the P2 and P4 phases to mitigate against charge injection errors that otherwise might occur.

In an embodiment, the integrator system 600 may include a controller 620 that generates the S₁, S₂, φ₂, φ₄ and φ_(SH), control signals in response to the input signal y(n) and an input clock signal that establishes a timing reference for the integrator system 600. The controller 620 may be a state machine that generates S₁, S₂, φ₂, φ₄ and φ_(SH) control signals at times illustrated in FIG. 6( b). Additionally, the controller 620 may include logic circuits (not shown) to logically combine the y(n), φ₁ and φ₃ signals to generate the S₁, S₂ control signals. In an embodiment, the controller 620 may include a register (not shown) that defines a sampling period for the integrator system 600 (and, consequently, its sampling frequency). The register may allow the sampling frequency to be a dynamically programmable value.

As indicated, input terminals of the sampling capacitors C_(INA), C_(INB) in the sampling circuits 602, 604 may be shorted between each operational phase change (between phases P2 and P4). The input terminals of the sampling capacitors C_(INA), C_(INB), therefore, may charge to a level of the V_(REF+) and V_(REF−), specifically their common mode value. In an embodiment, when C_(FA)=C_(FB)=C_(F), C_(INA)=C_(INB)=C_(IN), the average current drawn from nodes V_(REF+) and V_(REF−) may be expressed as:

I _(V) _(ref+) = −I _(V) _(ref−) =V _(ref) f _(s) C _(in).  Eq. 4

As seen by Eq. 4, the average drawn current may be independent of the signal content S₁, S₂ (y(n)). The average current may depend on reference voltage, sampling frequency, and aggregate size of the capacitors, but the average current may be substantially decoupled from the y(n) state dependence. By contrast, Eq. 2 demonstrates that current draw depends on signal content, which is reflected in use of the V_(REF), y(n) and V_(IN) terms respectively. By shorting the left plates of the input (sampling) capacitors, the charge transferred may not depend on the previous state of the circuit as in conventional systems.

FIG. 7 illustrates an integrator system 700 and control signals according to another embodiment of the present invention. As illustrated in FIG. 7( a), the integrator system 700 may be a multi-bit system that includes a plurality of sampling circuits 702.1-702.N, 704.1-704.N, an integrating amplifier 706 and a variety of shorting switches 708 (individual switches not labeled). The integrator system 700 may include a first sampling circuit 702.i and a second sampling circuit 704.i for each quantization level i of an input signal y(n). Thus, if the input signal y(n) has N quantization levels, there may be N first sampling circuits 702.1-702.N and N second sampling circuits 704.1-704.N provided in a paired relationship. Each sampling circuit 702.i, 704.i may sample respective components V_(REF+), V_(REF−) of the input signal V_(REF) having an orientation set by the control signal S_(1.i), S_(2.i) corresponding to quantization level i of an input signal y_(i)(n) and may output the sampled signal to the integrating amplifier 706 which are merged with outputs from the other sampling circuits. The integrating amplifier 706, as its name implies, may integrate the merger of the sampled signals and generate an output signal V_(Y) therefrom.

The first and second sampling circuits 702.1-702.N, 704.1-704.N may be constructed as in the embodiment of FIG. 6. For example, sampling circuits 702.1 and 704.1 each may include a respective sampling capacitor, C_(INA1), C_(INB1) and a variety of switches SW_(A1.1)-SW_(A1.4), SW_(B1.1)-SW_(B1.4). An input terminal of each sampling capacitor C_(INA1), C_(INB1) may be connected to reference voltages V_(REF+) and V_(REF−). Specifically, the input terminals of the sampling capacitors C_(INA1), C_(INB1) may be connected to the V_(REF+) voltage source by respective switches SW_(A1.1), SW_(B1.3), which may be controlled respectively by control signals S_(1.1) and S_(2.1). The input terminals of the sampling capacitors C_(INA1), C_(INB1) also may be connected to the V_(REF−) voltage source by respective second switches SW_(A1.3), SW_(B1.1), which may be controlled respectively by control signal S_(1.1) and S_(2.1). Output terminals of the sampling capacitors C_(INA1), C_(INB1) may be connected to a reference voltage V_(S) by respective third switches SW_(A1.2), SW_(B1.2), which may be controlled by another control signal φ₂. The output terminals of the sampling capacitors C_(INA1), C_(INB1) may be connected to the integrating amplifier 706 by respective fourth switches SW_(A1.4), SW_(B1.4), which may be controlled by a further control signal φ₄.

The first and second sampling circuits 702.2-702.N, 704.2-704.N of the other quantization level positions may be constructed similarly. That is, the sampling circuits 702.i and 704.i at each position i may include a respective sampling capacitor, C_(INAi), C_(INBi) and a variety of switches SW_(Ai.1)-SW_(Ai.4), SW_(Bi.1)-SW_(Bi.4). The switches SW_(Ai.1)-SW_(Ai.4), SW_(Bi.1)-SW_(Bi.4) may be controlled by respective switch control signals S_(1.i), S_(2.i), φ₂ and φ₄. The φ₂ and φ₄ control signals may be input to the output switches of each sampling circuit A and B in common.

The integrator system 700 may include a plurality of shorting switches 708, one provided for each position i. The shorting switches 708 may connect the input terminals of the sampling capacitors C_(INAi), C_(INBi) of each position to each other. All shorting switches 708 may be controlled by a common control signal φ_(SH).

The integrating amplifier 706 may include a differential amplifier 710 and a pair of feedback capacitors C_(FA), C_(FB). The first feedback capacitor C_(FA) may be coupled between a non-inverting input 712 and an inverting output 716 of the amplifier 710. The second feedback capacitor C_(FB) may be coupled between an inverting input 714 and a non-inverting output 718 of the amplifier 710. The non-inverting input 712 may be connected to outputs of the sampling circuits 704.1-704.N in common and the inverting input 714 may be connected to outputs of the sampling circuits 702.1-702.N in common.

As indicated, information content may be input to the integrator 700 by the S_(1.i) and S_(2.i) control signals that connect the sampling capacitors C_(INAi), C_(INBi) to the reference voltage sources V_(REF+), V_(REF−). Each S_(1.i) and S_(2.i) control signal may take one of the states of φ₁ or φ₃ based on the state of an input y_(i)(n) derived from the input signal y(n). When y_(i)(n) has a value of 1, the S_(1.i) control signal may be set to the φ₁ state and the S_(2.i) control signal may be set to the φ₃ state. Alternatively, when y_(i)(n) has a value of 1, the S_(1.i) control signal may be set to the φ₃ state and the S_(2.i) control signal may be set to the φ₁ state.

In another embodiment (not illustrated), the switches SW_(A1.2)-SW_(AN.2), SW_(A1.4)-SW_(AN.4), SW_(B1.2)-SW_(BN.2), SW_(B1.4)-SW_(BN.4), may be combined into single switches. In such an embodiment, the output terminals of the capacitors C_(INA1)-C_(INAN) from the sampling circuits 702.1-702-N may be coupled together at a common output node. A single switch (not shown) may couple the output node of the capacitors C_(INA1)-C_(INAN) to the reference voltage V_(S) in lieu of switches SW_(A1.2)-SW_(AN.2) and may be controlled by the φ₂ signal. A second switch (also not shown) may couple the output terminals of the capacitors C_(INA1)-C_(INAN) to the integrating amplifier 706 in lieu of switches SW_(A1.4)-SW_(AN.4) and may be controlled by the φ₄ signal. Similarly, the output terminals of the capacitors C_(INB1)-C_(INBN) from the sampling circuits 704.1-704.N may be coupled together at a common output node. A single switch (not shown) may couple the output node of the capacitors C_(INB1)-C_(INBN) to the reference voltage V_(S) in lieu of switches SW_(B1.2)-SW_(BN.2) and may be controlled by the φ₂ signal. A second switch (also not shown) may couple the output terminals of the capacitors C_(INB1)-C_(INBN) to the integrating amplifier 706 in lieu of switches SW_(B1.4)-SW_(BN.4) and may be controlled by the φ₄ signal.

FIG. 7( b) illustrates exemplary control signals that may be applied to the integrator system 700 for an pair of sampling circuit 702.i, 704.i, according to an embodiment of the present invention. FIG. 7( b) illustrates an example where y_(i)(n)=1 and, therefore, S_(1,i)=φ₁ and S_(2.i)=φ₃. FIG. 7( b) illustrates four phases of operation P1-P4 that may repeat throughout operation of the integrator system 700. Two phases P2 and P4 may be operational phases during which the sampling circuits 702.i and 704.i may be driven according to the input y_(i)(n) to alternately sample the reference signal and drive it to the integrating amplifier 706. The sampling circuits of other positions also may sample the reference signal and drive it to the integrating amplifier 706 based on the other quantization levels of the input signal y(n). Two other phases P1 and P3 may be reset phases during which voltages at the inputs of all sampling circuits 702.1-702.N, 704.1-704.N may be set to known states. In this manner, the integrator system 700 may process the input signal y(n) and yet establishes independence between the current drain drawn from the reference inputs and the input signal y(n).

Operation of sampling stages 702.i and 704.i may proceed as discussed above with respect to FIG. 6.

Operation of phases P1-P4 may repeat throughout operation of the integrator system 700. Thus, phase P5 is shown as subsequent iteration of phase P1 and phase P0 is shown as a prior iteration of phase P4. Of course, the control signals S_(1.i), S_(2.i) may vary in subsequent iterations based on new values of y(n) and, therefore, operation need not repeat from iteration to iteration.

In an embodiment, the integrator system 700 may include a controller 720 that generates the S_(1.1)-S_(1.N), S_(2.1)-S_(2.N), φ₂, φ₄ and φ_(SH), control signals in response to the input signal y(n) and an input clock signal that establishes a timing reference for the integrator system 700. The controller 720 may be a state machine that generates S_(1.1)-S_(1.N) S_(2.1)-S_(2.N), φ₂, φ₄ and φ_(SH) control signals at times illustrated in FIG. 7( b). Additionally, the controller 720 may include logic circuits (not shown) to logically combine each y_(i)(n) input with the φ₁ and φ₃ signals to generate the S_(1.i) and S_(2.i) control signals. In an embodiment, the controller 720 may include a register (not shown) that defines a sampling period for the integrator 700 and, consequently, its sampling frequency. The register may allow the sampling frequency to be a dynamically programmable value.

As indicated, input terminals of the sampling capacitors C_(INA1)-C_(INAN), C_(INB1)-C_(INBN) in the sampling circuits 702.1-702.N, 704.1-704.N may be shorted between each operational phase change (between phases P2 and P4). The input terminals of the sampling capacitors C_(INA1)-C_(INAN), C_(INB1)-C_(INBN), therefore, may charge to a level intermediate of V_(REF+) and V_(REF−), specifically their common mode value. In an embodiment, when C_(FA)=C_(FB)=C_(F) and C_(INAi)=C_(INBi)=C_(IN) (for all i), the average current drawn from nodes V_(REF+) and V_(REF−) may be expressed as:

I _(V) _(ref+) = −I _(V) _(ref−) =N*V _(ref) f _(s) C _(in).  Eq. 5

As seen by Eq. 5, the average drawn current may depend on the number N of stages but is independent of the signal content S_(1.i), S_(2,i) (y(n)). The average current may depend on reference voltage, sampling frequency, and aggregate size of the capacitors, but the average current may be substantially decoupled from the y(n) state dependence. By contrast, Eq. 2 demonstrates that current draw depends on signal content, which is reflected in use of the y(n) term.

FIG. 8 is a diagram of an integrator system 800 according to another embodiment of the present invention. The integrator system 800 of FIG. 8 may include two pairs of complementary sampling circuits 802.1, 802.2, 804.1 and 804.2, an integrating amplifier 806 and shorting switches 808.1, 808.2. The integrator system 800 may accept an input signal V_(IN) that is represented within the integrator system 800 as a pair of differential inputs V_(IN+) V_(IN−) that vary differentially with respect to each other.

The first pair of sampling circuits 802.1, 804.1 each may include a respective sampling capacitor, C_(INA1), C_(INB1) and a variety of switches SW_(A1.1)-SW_(A1.4), SW_(B1.1)-SW_(B1.4). A first terminal of each sampling capacitor C_(INA1), C_(INB1) (called, “input terminals” for convenience) may be connected to the V_(IN+) terminals by respective switches SW_(A1.1)-SW_(B1.3). The input terminal of each sampling capacitor C_(INA1), C_(INB1) also may be connected to the V_(IN)-terminals by respective second switches SW_(A1.3), SW_(B1.1). A second terminal of each sampling capacitor C_(INA1), C_(INB1) (called “output terminals,” for convenience) may be connected to a reference voltage V_(S) by respective third switches SW_(A1.2), SW_(B1.2). The output terminal of each sampling capacitor C_(INA1), C_(INB1) may be connected to the integrating amplifier 806 by respective fourth switches SW_(A1.3), SW_(B1.4). The switches SW_(A1.1), SW_(B1.1) may be controlled by a first control signal φ₁. The switches SW_(A1.2), SW_(B1.2) may be controlled by a second control signal φ₂. The switches SW_(A1.3), SW_(B1.3) may be controlled by a third control signal φ₃. The switches SW_(A1.4), SW_(B1.4) may be controlled by a fourth control signal φ₄.

The second pair of sampling circuits 802.2, 804.2 may have an architecture that operates in anti-phase to that of the first pair of sampling circuits 802.1, 804.1. The second pair of sampling circuits 802.2, 804.2 also may include respective sampling capacitors C_(INA2), C_(INB2) and a variety of switches SW_(A2.1)-SW_(A2.4), SW_(B2.1)-SW_(B2.4). An input terminal of each sampling capacitor C_(INA2), C_(INB2) may be connected to the V_(IN+) terminals by respective switches SW_(A2.3), SW_(B2.1). The input terminal of each sampling capacitors C_(INA2), C_(INB2) also may be connected to the V_(IN−) terminals by respective second switches SW_(A2.1), SW_(B2.3). An output terminal of each sampling capacitor C_(INA2), C_(INB2) may be connected to the V_(S) reference voltage by respective third switches SW_(A2.4), SW_(B2.4). The output terminal of each sampling capacitor C_(INA2), C_(INB2) may be connected to the integrating amplifier 806 by respective fourth switches SW_(A2.2), SW_(B2.2). The switches SW_(A2.1), SW_(B2.1) may be controlled by a control signal φ₁. The switches SW_(A2.2), SW_(B2.2) may be controlled by a control signal φ₂. The switches SW_(A2.3), SW_(B2.3) may be controlled by a control signal φ₃. The switches SW_(A2.4), SW_(B2.4) may be controlled by a control signal φ₄. Control of the switches SW_(A1.4), SW_(B1.4) and SW_(A2.2), SW_(B2.2) between the first pair of sampling circuits 802.1, 804.2 and the second pair of sampling circuits 802.2, 802.4 may cause the sampling circuits to operate in anti-phase with respect to each other. That is, a first pair of sampling circuits 802.1, 804.2 may sample the input voltage V_(IN+), V_(IN−) while the second pair of sampling circuits 802.2, 802.4 output previously-sampled input voltages to the integrating amplifier 806.

Shorting switches 808.1, 808.2 may connect the input terminals of each pair of sampling capacitors C_(INA1), C_(INB1) and C_(INA2), C_(INB2) to each other. The shorting switches 808.1, 808.2 may be controlled by a common control signal φ_(SH).

The integrating amplifier 806 may include a differential amplifier 810 and a pair of feedback capacitors C_(FA), C_(FB). The first feedback capacitor C_(FA) may be coupled between a non-inverting input 812 and an inverting output 816 of the amplifier 810. The second feedback capacitor C_(FB) may be coupled between an inverting input 814 and a non-inverting output 818 of the amplifier 810. The non-inverting input 812 may be connected to an output of sampling circuits 804.1, 804.2 (switches SW_(B1.4), SW_(B2.2)) and the inverting input 814 may be connected to an output of sampling circuits 802.1, 802.2 (switches SW_(A1.4), SW_(A2.2)).

In an embodiment, control of the integrator system 800 may proceed as illustrated in FIG. 3( b). Again, the phases P2 and P4 may be operational phases during which the pairs of sampling circuits 802.1, 804.1 and 802.2, 804.2 may alternately sample the input signal and drive the input signal to the integrating amplifier 306. Specifically, the first pair of sampling circuits 802.1, 804.1 may sample the input voltage during phase P2 and drive the sampled voltage during phase P4. The second pair of sampling circuits 802.2, 804.2 may sample the input voltage during phase P4 and drive the sampled voltage during phase P2. The other two phases P1 and P3 may be reset phases during which input terminals of the input capacitors C_(INA), C_(INB) may be set to voltages at intermediate levels between V_(IN+) and V_(IN−) without drawing current from circuit inputs, such as V_(IN+), V_(IN−).

FIG. 9 is a diagram of a multi-bit integrator system 900 according to another embodiment of the present invention. The integrator system 900 may include a plurality of sampling circuits 902.1-902.2N, 904.1-904.2N, an integrating amplifier 906 and a variety of shorting switches 908 (individual switches not labeled). In this system, if an input signal y(n) has N quantization levels, there may be 2N first sampling circuits 902.1-902.2N and 2N second sampling circuits 904.1-904.N provided in a paired relationship and grouped into two sets of N sampling circuit pairs. A first set of sampling circuit pairs 902.1-902.N, 904.1-902.N may sample an input signal during a first operational phase (say, phase P2) and may output the sampled signal during a second operational phase (P4), while the second set of sampling circuit pairs 902.N+1-902.2N, 904.N+1-902.2N may sample an input signal during the second operational phase (P4) and may output the sampled signal during the first operational phase (P2).

The sampling circuits 902.1-902.2N, 904.1-904.N may have a construction as in the FIG. 7 embodiment. Control signals S_(1.1)-S_(1.N), S_(2.1)-S_(2.N) to the input switches of first set of sampling circuit pairs 902.1-902.N, 904.1-904.N may operate with a half-cycle phase offset as compared to the control signals S_(1.N+1)-S_(1.2N), S_(2.N+1)-S_(2.2N) of the input switches for the second set of sampling circuit pairs 902.N+1-902.2N, 904.N+1-904.2N, as discussed in connection with the FIG. 7 embodiment.

The shorting switches 908 may connect the input terminals of the paired sampling capacitors among the sampling circuits 902.1-902.2N, 904.1-904.2N to each other. The shorting switches 908.1, 908.2 may be controlled by a common control signal φ_(SH), which may close during P1 and P3 phases as discussed in the prior embodiments.

The integrating amplifier 906 may include a differential amplifier 910 and a pair of feedback capacitors C_(FA), C_(FB). The first feedback capacitor C_(FA) may be coupled between a non-inverting input 912 and an inverting output 916 of the amplifier 910. The second feedback capacitor C_(FB) may be coupled between an inverting input 914 and a non-inverting output 918 of the amplifier 910. The non-inverting input 912 may be connected to an output of sampling circuit 904 and the inverting input 914 may be connected to an output of sampling circuit 902.

Several embodiments of the invention are specifically illustrated and/or described herein. However, it will be appreciated that modifications and variations of the invention are covered by the above teachings and within the purview of the appended claims without departing from the spirit and intended scope of the invention. 

We claim:
 1. An integrator system, comprising: an integrator having a pair of inputs, a pair of sampling circuits, each having a sampling capacitor, to sample respective components of a differential input signal on the sampling capacitor in a first phase of operation and to drive a representation of the sampled input signal to the integrator inputs in a second phase of operation, and a shorting switch to connect input terminals of the sampling capacitors together during third and fourth phases of operation that occur between successions of the first phase and the second phase.
 2. The integrator system of claim 1, wherein each sampling circuit comprises: a first switch coupling the input terminal of the sampling capacitor to a terminal for a first differential component of the input signal, a second switch coupling the input terminal of the sampling capacitor to a terminal for a second differential component of the input signal, complementary to the first differential component, a third switch coupling an output terminal of the sampling capacitor to a reference voltage, and a fourth switch coupling the output terminal of the sampling capacitor to the integrator.
 3. The integrator system of claim 1, wherein each sampling circuit comprises: a first switch coupling the input terminal of the sampling capacitor to a terminal for a first reference voltage, a second switch coupling the input terminal of the sampling capacitor to a terminal for a second reference voltage having a different voltage level than the first reference voltage, a third switch coupling an output terminal of the sampling capacitor to a third reference voltage, and a fourth switch coupling the output terminal of the sampling capacitor to the integrator.
 4. The integrator system of claim 3, wherein the first and second switches of the sampling circuit are controlled by a binary control signal during the first and second phases.
 5. The integrator system of claim 1, further comprising: a second pair of sampling circuits, each having a sampling capacitor, to sample respective components of a differential input signal on the sampling capacitor in the second phase of operation and to drive the sampled input signal to the integrator inputs in the first phase of operation, and a second shorting switch to connect together input terminals of the capacitors of the second pair of sampling circuits during the third phase of operation.
 6. A method of integrating a differential input signal, comprising, iteratively: in a first phase of operation, sampling differential components of the input signal on respective capacitors, in a second phase of operation, shorting input terminals of the capacitors together, in a third phase of operation, driving the sampled input signal to an output circuit using a differential voltage source, and in a fourth phase of operation, shorting the input terminals of the capacitors together.
 7. The method of claim 6, further comprising a first pair of switches, each coupling an input terminal of a respective capacitor to a respective component of the input signal.
 8. The method of claim 6, further comprising a first pair of switches, each coupling an input terminal of a respective capacitor to a respective reference voltage and controlled by the input signal.
 9. The method of claim 6, further comprising in the first phase of operation, driving differential components of a previously-sampled input signal from a second pair of capacitors, in the second phase of operation, shorting input terminals of the second pair of capacitors together, and in the third phase of operation, sampling differential components of another portion of the input signal on the second pair of capacitors, and in the fourth phase of operation, shorting the input terminals of the capacitors together.
 10. A multi-bit integrator system, comprising: a differential integrator having a pair of inputs; a plurality of pairs of sampling circuits, each having: a sampling capacitor, a pair of input switches, each connecting an input terminal of the sampling capacitor to a respective one of a pair of differential reference voltages, wherein switch control signals of the input switches carry digital information to be sampled by the integrator system, a third switch connecting an output terminal of the sampling capacitor to another reference voltage, and a fourth switch connecting the output terminal of the sampling capacitor to a respective input of the differential integrator; and a plurality of shorting switches, each connected between input terminals of sampling capacitors of a respective pair of sampling circuits.
 11. The integrator system of claim 10, further comprising: a second plurality of pairs of sampling circuits, each having: a sampling capacitor, a pair of input switches, each connecting an input terminal of the sampling capacitor to a respective one of a pair of differential reference voltages, wherein switch control signals of the input switches carry digital information to be sampled by the integrator system, a third switch connecting an output terminal of the sampling capacitor to another reference voltage, a fourth switch connecting the output terminal of the sampling capacitor to a respective input of the differential integrator, and a plurality of shorting switches, each connected between input terminals of sampling capacitors of a respective pair of sampling circuits; and wherein the sampling circuits of the first and second pluralities sample the digital information and output the sampled information to the differential integrator in different phases from each other.
 12. The integrator system of claim 11, wherein the shorting switches of the first and second pluralities of sampling circuits close in a common phase of operation.
 13. A multi-bit integrator system, comprising: a differential integrator having a pair of inputs; a plurality of pairs of sampling circuits, each having: a sampling capacitor, and a pair of input switches, each connecting an input terminal of the sampling capacitor to a respective one of a pair of differential reference voltages, wherein switch control signals of the input switches carry digital information to be sampled by the integrator system; a pair of first output switches, one of the first output switches connecting output terminals of the sampling capacitors from a first one of the pairs of sampling circuits to a third reference voltage, the other of the first output switches connecting output terminals of the sampling capacitors from a second one of the pairs of sampling circuits to the third reference voltage; a pair of second output switches, one of the second output switches connecting output terminals of the sampling capacitors from the first one of the pairs of sampling circuits to a first input of the differential integrator, the other of the second output switches connecting output terminals of the sampling capacitors from the second one of the pairs of sampling circuits to a second input of the differential integrator; and a plurality of shorting switches, each connected between input terminals of the sampling capacitors from a respective pair of sampling circuits.
 14. A sigma delta modulator, comprising: a differential integrator having a pair of inputs; a sampling system having input terminals for a differential input voltage; the sampling system having a pair of sampling circuits, each having a sampling capacitor, to sample respective components of the differential input voltage on the sampling capacitor in a first phase of operation and to drive the sampled input signal respectively to the integrator inputs in a second phase of operation; a shorting switch to connect input terminals of the sampling capacitors together during a third phase of operation between the first phase and the second phase; an analog-to-digital converter (ADC) having input terminals in communication with output terminals of the sampling system; and a digital to analog converter (DAC) provided in a feedback path of the modulator, having an input coupled to an output of the ADC.
 15. The modulator of claim 14, wherein the differential integrator system is provided in the sampling system and each sampling circuit comprises: a first switch coupling the input terminal of the sampling capacitor to a terminal for a first differential component of the input signal, a second switch coupling the input terminal of the sampling capacitor to a terminal for a second differential component of the input signal, complementary to the first differential component, a third switch coupling an output terminal of the sampling capacitor to a reference voltage, and a fourth switch coupling the output terminal of the sampling capacitor to the integrator.
 16. A method of integrating a differential input signal, comprising, iteratively: in a first phase of operation, sampling differential components of the input signal on a pair of capacitors, in a second phase of operation, redistributing charge between input terminals of the pair of capacitors, in a third phase of operation, driving the sampled input signal from the capacitors to an integration amplifier, and in a fourth phase of operation, redistributing charge between input terminals of the pair of capacitors.
 17. The method of claim 16, wherein, during the second and fourth phases of operation, the charge redistribution occurs without supply of current from a source of the input signal.
 18. The method of claim 16, wherein, during the second and fourth phases of operation, the charge redistribution occurs without supply of current from any power supply of a system in which the method is performed. 